发明名称 |
METHOOD FOR PATTERN DETECTING OF OVER-SAMPLING IMAGE, APPARATUS FOR OPTICAL INFORMATION PROCESSING BY USING SAME AND METHOD FOR OPTICAL INFORMATION PROCESSING BY USING SAME |
摘要 |
A method for detecting pattern of over-sampling image, an apparatus for processing optical information by using the same and a method for processing optical information by using the same are provided to improve the reliability of the reproduced optical information by finding the data having a specific pattern like a mark at the image of an oversampled data page. A method for detecting pattern of over-sampling image comprises: a step(S110) detecting the detection image of a data page by oversampling the data page; a step comparing the detection image with the reference image of the oversampling to the pattern through covariance; and a step producing the pixel of the oversampled pattern with the detection image compared by covariance and the value of the reference image.
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申请公布号 |
KR20090071122(A) |
申请公布日期 |
2009.07.01 |
申请号 |
KR20070139331 |
申请日期 |
2007.12.27 |
申请人 |
DAEWOO ELECTRONICS CORPORATION |
发明人 |
JUNG, KYU IL |
分类号 |
G11B7/0065;G11B7/005 |
主分类号 |
G11B7/0065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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