发明名称 METHOOD FOR PATTERN DETECTING OF OVER-SAMPLING IMAGE, APPARATUS FOR OPTICAL INFORMATION PROCESSING BY USING SAME AND METHOD FOR OPTICAL INFORMATION PROCESSING BY USING SAME
摘要 A method for detecting pattern of over-sampling image, an apparatus for processing optical information by using the same and a method for processing optical information by using the same are provided to improve the reliability of the reproduced optical information by finding the data having a specific pattern like a mark at the image of an oversampled data page. A method for detecting pattern of over-sampling image comprises: a step(S110) detecting the detection image of a data page by oversampling the data page; a step comparing the detection image with the reference image of the oversampling to the pattern through covariance; and a step producing the pixel of the oversampled pattern with the detection image compared by covariance and the value of the reference image.
申请公布号 KR20090071122(A) 申请公布日期 2009.07.01
申请号 KR20070139331 申请日期 2007.12.27
申请人 DAEWOO ELECTRONICS CORPORATION 发明人 JUNG, KYU IL
分类号 G11B7/0065;G11B7/005 主分类号 G11B7/0065
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