| 摘要 |
An apparatus for testing a semiconductor chip is provided to recognize an electric current easily by separating ground connection of each power supply terminal to prepare overplus electric current. A plurality of power supply stages(102/1,102/2) supplies power to a semiconductor chip including an electric source input. A tester(104) measures an output current of the power supply stages. The tester generates a switching control signal from the tester. A plurality of relaie(108/a,108/b,108/c) are formed is formed between a common ground of the tester and a plurality of power supply stages, and performs close or open operation. A tester bit setting part sets up a data bit to perform close operation according to switching control signals.
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