| 摘要 |
A test device of a memory device is provided to select an optimum driving force of a word line driver by controlling the number of bits of a selection signal according to a size of the word line driver. A test device of a memory device includes a programmable redundancy decoder(50) and a delay difference generating part(60A). The programmable redundancy decoder outputs a driving force corresponding to a selection signal(SEL) to a word line of a redundancy memory(20A). The programmable redundancy decoder determines different driving force of 2n in case the number of bits of the selection signal is n. The delay difference generating part generates a delay difference signal corresponding to a delay difference between a first word line signal and a second word line signal outputted from the redundancy memory. |
