发明名称 Power semiconductor component with charge compensation structure and method for the fabrication thereof
摘要 A semiconductor component (1) with charge compensation structure (3) has a semiconductor body (4) having a drift path (5) between two electrodes (6, 7). The drift path (5) has drift zones of a first conduction type, which provide a current path between the electrodes (6, 7) in the drift path, while charge compensation zones (11) of a complementary conduction type constrict the current path of the drift path (5). For this purpose, the drift path (5) has two alternately arranged, epitaxially grown diffusion zone types (9, 10), the first drift zone type (9) having monocrystalline semiconductor material on a monocrystalline substrate (12), and a second drift zone type (10) having monocrystalline semiconductor material in a trench structure (13), with complementarily doped walls (14, 15), the complementarily doped walls (14, 15) forming the charge compensation zones (11).
申请公布号 US7554137(B2) 申请公布日期 2009.06.30
申请号 US20060552804 申请日期 2006.10.25
申请人 INFINEON TECHNOLOGIES AUSTRIA AG 发明人 SEDLMAIER STEFAN;SCHULZE HANS-JOACHIM;MAUDER ANTON;STRACK HELMUT;WILLMEROTH ARMIN;PFIRSCH FRANK
分类号 H01L29/732;H01L29/423 主分类号 H01L29/732
代理机构 代理人
主权项
地址