发明名称 Reducing effects of parasitic transistors in thyristor-based memory using an isolation or damage region
摘要 An integrated circuit having memory, including thyristor-based memory cells, is described, where each of the thyristor-based memory cells includes a thyristor-based storage element and an access transistor. Where the thyristor-based storage element includes an anode region and a cathode region, a pair of the thyristor-based memory cells are commonly coupled via a bitline associated with the access transistor or via a reference voltage line coupled to the anode region. Bitline or anode regions are separated from one another by an isolation region. In another configuration, a bitline region has a locally implant-damaged region to inhibit charge transfer between the pair. In yet another configuration, a storage node contact or contacts respectively can extend over or are coupled to a storage node line extending over an isolation region. In this latter configuration, a source/drain region and the cathode region are separated from one another by an isolation region.
申请公布号 US7554130(B1) 申请公布日期 2009.06.30
申请号 US20060361869 申请日期 2006.02.23
申请人 T-RAM SEMICONDUCTOR, INC. 发明人 ROBINS SCOTT;YANG KEVIN J.;GUPTA RAJESH N.
分类号 H01L29/74 主分类号 H01L29/74
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