Measuring Apparatus and Method of Nano-wire Physical Properties,申请号KR20070116170-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Measuring Apparatus and Method of Nano-wire Physical Properties
摘要
申请公布号	KR100905405(B1)	申请公布日期	2009.06.30
申请号	KR20070116170	申请日期	2007.11.14
申请人		发明人
分类号	G01N3/08;G01N3/00	主分类号	G01N3/08
代理机构		代理人
主权项
地址

您可能感兴趣的专利

POLYURETHANES CONTAINING DISPERSED CRYSTALLINE POLYESTERS

A NOVEL POLYPEPTIDE-DNA MISMATCH REPAIR PROTEIN 10 AND THE POLYNUCLEOTIDE ENCODING SAID POLYPEPTIDE

LICENSE MANAGER

A WHITE LIGHT EMITTING PHOSPHOR BLEND FOR LED DEVICES

UNIT CELL WITH FAN-OUT FOR LARGE FOCAL PLANE ARRAYS WITH SMALL DETECTOR PITCH

DEVICE FOR DESTROYING HAZARDOUS SUBSTANCES (VARIANTS)

Use of cold gas spraying or flame spraying of metals and alloys and mixtures or composite materials of metals and alloys to produce layer(s) on electrical contacts, carriers for contacts, electrical conductors and on strips or profiles

A DEVICE FOR THE SEPARATION OF A SERIES OF PRODUCTS THAT ARE SUPERPOSED IN A SCALE-LIKE FASHION

NOVEL BENZOFURAN DERIVATIVES

GENE RESPONSIBLE FOR STARGARDT-LIKE DOMINANT MACULAR DYSTROPHY

PIPERIDYINDOLES AS SEROTONIN RECEPTOR LIGANDS

METHOD AND APPARATUS FOR PRODUCTION OF HIGH PURITY SILICON

AUTOMATIC ACCIDENT REPORTING APPARATUS FOR TWO-WHEELED VEHICLES

SEAT BELT FORCE SENSOR SYSTEM

Device for the inspection of the edge of razor blades

An image forming apparatus administration system

METHOD OF PURIFYING AMIDE COMPOUND

Method for selectively etching a SiOF film