发明名称 PHASE CHANGE MEMORY DEVICE
摘要 A phase change memory device is provided to change a reference voltage according to a change of a bit line clamp voltage, thereby regularly controlling margins of a sensing voltage. A reference voltage controller(100) comprises as follows. A reference current controlling resistance unit(110) controls a sensing current of a reference cell array. A sensing current-to-voltage converter(120) converts an output current of the resistance unit into a second sensing voltage. A reference voltage fine controller outputs a reference control signal corresponding to a change of the second sensing voltage. A reference variable driver variably drives a level of a first reference voltage according to a second reference voltage and a reference control signal.
申请公布号 KR100905188(B1) 申请公布日期 2009.06.29
申请号 KR20070141510 申请日期 2007.12.31
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, HEE BOK;HONG, SUK KYOUNG
分类号 G11C13/02;G11C7/12 主分类号 G11C13/02
代理机构 代理人
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