发明名称 METHOD OF FABRICATING SCHOTTKY BARRIER TRANSISTOR
摘要 A method for manufacturing a schottky barrier transistor is provided to improve a scaling-down effect due to an alignment error by performing a mask process twice in a perpendicular direction. A pair of cavities and a channel forming part are formed on a substrate(200). The cavities are used for forming a source forming part and a drain forming part. A channel forming part having a shape of fin is formed between the cavities. The cavities are filled with a metal. A channel(210), a source(221), and a drain are formed by patterning the channel forming part, the source forming part, and the drain forming part in a perpendicular direction to the longitudinal direction of the channel forming part. A gate oxide layer for covering the source, the drain, and the channel forming part and a gate metal layer are sequentially formed on the substrate. A gate electrode is formed on the channel layer by patterning the gate metal layer. A schottky barrier is formed by processing thermally the substrate.
申请公布号 KR20090068687(A) 申请公布日期 2009.06.29
申请号 KR20070136399 申请日期 2007.12.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SUNG HO;NOH, JIN SEO;JEON JOONG S.;BAE, EUN JU
分类号 H01L21/336;H01L21/338 主分类号 H01L21/336
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