发明名称 |
METHOD FOR FORMING VERTICAL CHANNEL TRANSISTER IN SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for manufacturing a vertical channel transistor of a semiconductor device is provided to prevent the attack of a mask pattern and a semiconductor pillar by using a high-dielectric constant layer instead of a conventional nitride layer. A method for manufacturing a vertical channel transistor of a semiconductor device comprises the following steps of: forming a mask pattern on a semiconductor substrate(30) to form a semiconductor pillar; etching the mask pattern(31) in predetermined depth by using an etching barrier in order to form the top of the semiconductor pillar; forming a first spacer(32) consisting of a high-dielectric constant layer on the top and side wall of the semiconductor pillar and the mask pattern; and etching the mask pattern and the first spacer in the predetermined depth by using the etching barrier so as to form the bottom of the semiconductor pillar.</p> |
申请公布号 |
KR20090068777(A) |
申请公布日期 |
2009.06.29 |
申请号 |
KR20070136532 |
申请日期 |
2007.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KANG, HYE RAN;KIM, KWANG OK |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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