发明名称 METHOD FOR FORMING VERTICAL CHANNEL TRANSISTER IN SEMICONDUCTOR DEVICE
摘要 <p>A method for manufacturing a vertical channel transistor of a semiconductor device is provided to prevent the attack of a mask pattern and a semiconductor pillar by using a high-dielectric constant layer instead of a conventional nitride layer. A method for manufacturing a vertical channel transistor of a semiconductor device comprises the following steps of: forming a mask pattern on a semiconductor substrate(30) to form a semiconductor pillar; etching the mask pattern(31) in predetermined depth by using an etching barrier in order to form the top of the semiconductor pillar; forming a first spacer(32) consisting of a high-dielectric constant layer on the top and side wall of the semiconductor pillar and the mask pattern; and etching the mask pattern and the first spacer in the predetermined depth by using the etching barrier so as to form the bottom of the semiconductor pillar.</p>
申请公布号 KR20090068777(A) 申请公布日期 2009.06.29
申请号 KR20070136532 申请日期 2007.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, HYE RAN;KIM, KWANG OK
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
代理机构 代理人
主权项
地址