发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>A method for manufacturing a semiconductor element is provided to prevent leakage current by removing impurities such as minute oxide film. A method for manufacturing a semiconductor element comprises: a forming a gate pattern on a substrate; a step of forming a insulation film on a whole structure containing the gate pattern; a step of opening both sides of gate pattern; a step of performing pre-treatment including treatment, washing and hydrogen bake; and a step of forming epitaxial layer on the exposed substrate.</p>
申请公布号 KR20090068876(A) 申请公布日期 2009.06.29
申请号 KR20070136670 申请日期 2007.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN, TAE HANG;KOH, CHUNG GEUN;LEE, YOUNG HO
分类号 H01L29/78 主分类号 H01L29/78
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