发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for manufacturing a semiconductor element is provided to prevent leakage current by removing impurities such as minute oxide film. A method for manufacturing a semiconductor element comprises: a forming a gate pattern on a substrate; a step of forming a insulation film on a whole structure containing the gate pattern; a step of opening both sides of gate pattern; a step of performing pre-treatment including treatment, washing and hydrogen bake; and a step of forming epitaxial layer on the exposed substrate.</p> |
申请公布号 |
KR20090068876(A) |
申请公布日期 |
2009.06.29 |
申请号 |
KR20070136670 |
申请日期 |
2007.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
AHN, TAE HANG;KOH, CHUNG GEUN;LEE, YOUNG HO |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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