发明名称 SYSTEM AND METHOD FOR ANALYZING IMPURITIES OF AN OBJECT
摘要 A computer-implemented method for analyzing impurities of an object is provided. The method includes selecting a region from an image of the object, pre-treating the region to calculate a threshold, processing the region and deleting the points from an outer layer of the region. The method further includes setting a starting point and search directions, determining a point before a first boundary point as an origin of the region and searching the next boundary points if the first boundary point has been searched. The method also includes searching all the boundary points in the region, forming an impurity if the last boundary point coincides with the first boundary point, seed filling the impurity and calculating an area value, and comparing the area value with an allowable area value to determine whether the impurity satisfies impurity specifications.
申请公布号 US2009161940(A1) 申请公布日期 2009.06.25
申请号 US20080253931 申请日期 2008.10.17
申请人 HONG FU JIN PRECISION INDUSTRY(SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 CHANG CHIH-KUANG;CHEN XIAN-YI;HONG YI-RONG
分类号 G06K9/62 主分类号 G06K9/62
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