| 摘要 |
PROBLEM TO BE SOLVED: To cope with data storage devices having different specifications by one processor, in a test device of a data storage device. SOLUTION: The test device has a processor card 6, and adapter cards a, 3b. The adapter cards 3a, 3b have power supply circuits 33a, 33b, 34a, 34b generating power supply voltage supplied to HDD 1a, 1b. The test device can flexibly correspond to HDDs having various specifications by one processor card by mounting power supply circuits in the adapter card. It is not necessary to mount a plurality of power supply circuits in the processor card to simultaneously test a plurality of HDDs by one processor card, thereby reducing size of the processor card. COPYRIGHT: (C)2009,JPO&INPIT
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