发明名称 METHOD FOR CLEANING WAFER MOUNTING BASE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for cleaning a wafer mounting base, in which a semiconductor manufacturing apparatus can be cleaned without being stopped and production efficiency can be improved. <P>SOLUTION: Disclosed is the cleaning method for the wafer mounting base which uses a cleaning wafer having an uneven pattern on a surface, the cleaning method including steps of: mounting the cleaning wafer on the wafer mounting base not at a regular position with the surface of the cleaning wafer 11 opposed to the surface of the wafer mounting base 14; and moving the cleaning wafer 11 to the regular position on the wafer mounting base 14 by correcting the position of the cleaning wafer 11 using a mechanism which corrects the position of the cleaning wafer 1 mounted on the surface of the wafer mounting base to the regular position. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009141384(A) 申请公布日期 2009.06.25
申请号 JP20090051439 申请日期 2009.03.05
申请人 OKI SEMICONDUCTOR CO LTD;OKI SEMICONDUCTOR MIYAZAKI CO LTD 发明人 TAZAKI YOSHIHIDE
分类号 H01L21/683;G03F7/20;H01L21/027 主分类号 H01L21/683
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