发明名称 FIXTURE FOR INSPECTING DISPLAY PANEL AND DISPLAY PANEL INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a fixture for inspecting a thin display panel which achieves secure contact. SOLUTION: The fixture 1 for inspection includes a probe 20 for inspection, and a panel guide plate 10 having a positioning member 11 to position and guide a liquid crystal panel 3 to in a plane direction. The probe 20 for inspection has: a probe holding plate 21 hinge-connected to the panel guide plate 10 via a shaft member 121; a probe wiring member 22 having a plurality of bumps 221 protruding toward terminals of the liquid crystal panel 3; a membrane 23 interposed between the probe holding plate 21 and the probe wiring member 22; and a pressurizing member 24 mounted on a position different from those of the bump 221 and the membrane 23 in the plane direction of the liquid crystal panel 3 and pressurizing the probe holding plate 21 and the panel guide plate 10 to directions approaching each other, wherein openings are formed on positions of each of the probe holding plate 21 and the panel guide plate 10 corresponding to image regions of the liquid crystal panel 3. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009139391(A) 申请公布日期 2009.06.25
申请号 JP20070312156 申请日期 2007.12.03
申请人 SEIKO EPSON CORP 发明人 NAKATANI TOSHIYUKI;YAMAGISHI HIDEKAZU
分类号 G02F1/13;G01R31/00;G09F9/00 主分类号 G02F1/13
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