发明名称 MEASUREMENT METHOD OF CUTOFF WAVELENGTH AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a measurement method of a cutoff wavelength by a bending method for improving measurement accuracy by keeping side pressure received by an optical fiber by contact pressure with a mandrel below a certain value regardless of the level of skill of a measuring person. SOLUTION: In this measurement method of a cutoff wavelength, transmitted light power P1 when a bend of a diameter of 280 mm and a bend of a diameter of 60 mm are applied to an optical fiber 1 of a predetermined length, and transmitted light power P2 when only the bend of a diameter of 280 mm is applied to the optical fiber 1 are measured, and a cutoff wavelengthλc is measured from the ratio of the transmitted light power values. In the measurement method, at least a first mandrel 3 out of the first mandrel and a second mandrel 5 includes a side pressure reduction mechanism 21 reducing side pressure acting on the optical fiber 1 in winding it, whereby an excitation state is prevented from becoming unstable by the influence of the side pressure to degrade measurement accuracy. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009139304(A) 申请公布日期 2009.06.25
申请号 JP20070318024 申请日期 2007.12.10
申请人 SUMITOMO ELECTRIC IND LTD 发明人 TEI KANEHIRO
分类号 G01M11/00 主分类号 G01M11/00
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