发明名称 SURFACE DEFECT TREATMENT METHOD, AND SURFACE DEFECT TREATMENT SELECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To select and apply an optimum defect treatment method to a condition of an individual surface defect occurring in an in-furnace apparatus. SOLUTION: This surface defect treatment method after detecting defects 2, 2a of a member surface 1a includes: a defect depth determination process (S101) of measuring the depths of the defects 2, 2a to compare the depths of the defects 2, 2a with a reference depth to determine the depths; a propagation determination process (S102) of determining whether the depths of the defects 2, 2a are further increased when continuously used in common when the depths of the defects 2, 2a are determined to be smaller than the reference depth in the defect depth determination process (S101); and a defect range determination process (S103) of measuring the ranges of the defects 2, 2a to compare the ranges of the defects 2, 2a with a reference range to determine the depths when determined the depths of the defects 2, 2a are determined to be larger than the reference depth in the defect depth determination process (S101). COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009139300(A) 申请公布日期 2009.06.25
申请号 JP20070317937 申请日期 2007.12.10
申请人 TOSHIBA CORP 发明人 ITAYA MASAO;SAITO TOSHIYUKI;HAYASHI TAKAHIRO
分类号 G21C17/003;B23K31/00;G01N19/00;G21C17/00;G21C19/02 主分类号 G21C17/003
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