发明名称 RESIST COMPOSITION, RESIST PATTERN FORMING METHOD AND COMPOUND
摘要 This resist composition is a resist composition containing a compound in which a portion or all of hydrogen atoms of phenolic hydroxyl groups in a polyhydric phenol compound (a) having two or more phenolic hydroxyl groups and having a molecular weight of 300 to 2,500 are substituted with at least one selected from the group consisting of acid dissociable dissolution inhibiting groups represented by the following general formulas (p1) and (p2) wherein R1 and R2 each independently represents a branched or cyclic alkyl group, and may contain a hetero atom in the structure; R3 represents a hydrogen atom or a lower alkyl group; and n' represents an integer of 1 to 3.
申请公布号 US2009162781(A1) 申请公布日期 2009.06.25
申请号 US20050718091 申请日期 2005.09.30
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 SHIONO DAIJU;HIRAYAMA TAKU;OGATA TOSHIYUKI;HADA HIDEO
分类号 G03F7/20;C07C39/04;C07C43/205;C07C69/616;G03F7/004 主分类号 G03F7/20
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