发明名称 POLARIZATION ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide a thin polarizer array and a wavelength plate array which are composed of micro regions having different optical axis directions and wavelength characteristics and have a high extinction ratio and a low insertion loss, and to provide a polarization analyzer using the thin polarizer array and the wavelength plate array. SOLUTION: An array of micro periodic grooves is formed on a substrate, with the directions changed from one region to another. Subsequently, an alternating multilayer film of a high refractive index material such as Si or Ta<SB>2</SB>O<SB>5</SB>and a low refractive index material such as SiO<SB>2</SB>is formed by bias sputtering. By selecting a condition that each layer maintains a periodic protruded/recessed shape, an array of photonic crystal polarizer is formed. By mounting the array of photonic crystal polarizer in a photodetector array, the polarization analyzer that is small, has no movable part, is composed of a small number of components and permits high-precision measurement can be constituted. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009139973(A) 申请公布日期 2009.06.25
申请号 JP20090025700 申请日期 2009.02.06
申请人 AUTOCLONING TECHNOLOGY:KK 发明人 KAWAKAMI SHOJIRO;SATO TAKASHI;KAWASHIMA TAKAYUKI;ISHIKAWA OSAMU
分类号 G02B5/30;G01J4/04;G02B27/28 主分类号 G02B5/30
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