| 摘要 |
PROBLEM TO BE SOLVED: To reduce a circuit area of a semiconductor device to be designed. SOLUTION: This circuit analysis apparatus 30 is provided with a storage device 33 for storing a package model 1, a noise source model 3, a noise-subjected circuit model 2, and a substrate model 4 which are lumped constant circuits, and a noise analysis part 108 for generating an analysis target circuit model 200 by connecting the package model 1, the noise source model 3, the noise-subjected circuit model 2, and the substrate model 4. The noise analysis part 108 applies circuit simulation to the analysis target circuit model 200 to calculate and output a power supply voltage waveform in a noise-subjected circuit. COPYRIGHT: (C)2009,JPO&INPIT
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