发明名称 Structure and process for the formation of TSVs
摘要 An integrated circuit structure includes a semiconductor substrate; an interconnect structure over the semiconductor substrate, wherein the interconnect structure comprises a top inter-metal dielectric (IMD); an opening penetrating the interconnect structure into the semiconductor substrate; a conductor in the opening; and an isolation layer having a vertical portion and a horizontal portion physically connected to each other. The vertical portion is on sidewalls of the opening. The horizontal portion is directly over the interconnect structure. The integrated circuit structure is free from passivation layers vertically between the top IMD and the horizontal portion of the isolation layer.
申请公布号 US2009160058(A1) 申请公布日期 2009.06.25
申请号 US20080152381 申请日期 2008.05.14
申请人 KUO CHEN-CHENG;CHING KAI-MING;CHEN-SHIEN CHEN 发明人 KUO CHEN-CHENG;CHING KAI-MING;CHEN-SHIEN CHEN
分类号 H01L23/522 主分类号 H01L23/522
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