发明名称 MALFUNCTION DETECTION SYSTEM AND INTEGRATED CIRCUIT
摘要 The present invention is applicable to various sensor outputs including pulse signals and reduces cost for detecting malfunction. The malfunction detection system detects a malfunction in a sensor, and the malfunction detection system includes a sensor including a first terminal, and which outputs a sensor output current that varies a voltage level of the first terminal, a current output unit which varies the voltage level of the first terminal by outputting a constant current for judging to the sensor via the first terminal, and a judging unit which judges that the sensor is malfunctioning when the current for judging causes the voltage level of the first terminal to be equal to or higher than a threshold in a period different from a first period where the sensor output current causes the voltage level of the first terminal to be equal to or higher than the threshold.
申请公布号 US2009164162(A1) 申请公布日期 2009.06.25
申请号 US20080275509 申请日期 2008.11.21
申请人 PANASONIC CORPORATION 发明人 SADAYUKI EIICHI;SUMI TATSUMI
分类号 G01N37/00;G01R31/00 主分类号 G01N37/00
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