发明名称 NON-VOLATILE MEMORY DEVICE HAVING CHARGE TRAPPING LAYER AND METHOD FOR PROGRAMMING THE SAME
摘要 <p>A non-volatile memory device and a programming method thereof are provided to increase data storage capacity while not increasing physical size of a memory cell. A plurality of cell strings are arranged in a non-volatile memory device. Each of the cell strings has a drain selection transistor(DSL) and a source selection transistor, and a plurality of memory cells connected in series between the drain selection transistor and the source selection transistor. A memory cell transistor has a tunneling layer(310), an electric charge trapping layer(320), a shielding layer(330) and a control gate electrode(340) sequentially formed on a semiconductor substrate. At least one of the drain selection transistor and the source selection transistor has the same cell structure as the memory cell so as to program data.</p>
申请公布号 KR20090067996(A) 申请公布日期 2009.06.25
申请号 KR20070135846 申请日期 2007.12.21
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SE JUN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
代理机构 代理人
主权项
地址
您可能感兴趣的专利