发明名称 DENSITY MULTIPLICATION AND IMPROVED LITHOGRAPHY BY DIRECTED BLOCK COPOLYMER ASSEMBLY
摘要 Methods to pattern substrates with dense periodic nanostructures that combine top-down lithographic tools and self-assembling block copolymer materials are provided. According to various embodiments, the methods involve chemically patterning a substrate, depositing a block copolymer film on the chemically patterned imaging layer, and allowing the block copolymer to self-assemble in the presence of the chemically patterned substrate, thereby producing a pattern in the block copolymer film that is improved over the substrate pattern in terms feature size, shape, and uniformity, as well as regular spacing between arrays of features and between the features within each array compared to the substrate pattern. In certain embodiments, the density and total number of pattern features in the block copolymer film is also increased. High density and quality nanoimprint templates and other nanopatterned structures are also provided.
申请公布号 WO2009079241(A2) 申请公布日期 2009.06.25
申请号 WO2008US85742 申请日期 2008.12.05
申请人 WISCONSIN ALUMNI RESEARCH FOUNDATION;HITACHI GLOBAL STORAGE TECHNOLOGIES, INC.;NEALEY, PAUL, FRANKLIN;KANG, HUIMAN;DETCHEVERRY, FRANCOIS;DEPABLO, JUAN, J.;RUIZ, RICARDO;ALBRECHT, THOMAS 发明人 NEALEY, PAUL, FRANKLIN;KANG, HUIMAN;DETCHEVERRY, FRANCOIS;DEPABLO, JUAN, J.;RUIZ, RICARDO;ALBRECHT, THOMAS
分类号 G03F7/00;G11B5/855 主分类号 G03F7/00
代理机构 代理人
主权项
地址