发明名称 |
Organic Electroluminescence Element Defect Inspection Apparatus, Organic Electroluminescence Element And Organic Electroluminescence Element Defect Inspection Method |
摘要 |
One embodiment of the present invention is an organic electroluminescence element defect inspection apparatus wherein the apparatus brings in an optical image of a substrate to be inspected and detects a pattern defect of an organic luminescent layer on the substrate to be inspected. The above is performed after an organic luminescent layer is formed on a substrate in a method of manufacturing an organic electroluminescence element. The organic electroluminescence element includes at least one or more organic luminescent layers having a luminescence area, an anode which injects a hole into the organic luminescent layer and a cathode which injects an electrode into the organic luminescent layer on a substrate. And an optical source for obtaining an optical image from a substrate to be inspected is infra-red radiation. |
申请公布号 |
US2009159817(A1) |
申请公布日期 |
2009.06.25 |
申请号 |
US20080340430 |
申请日期 |
2008.12.19 |
申请人 |
TOPPAN PRINTING CO., LTD. |
发明人 |
IRIE KAZUNOBU;OOSONO TETSUO |
分类号 |
G01N21/00;G01M99/00;H01J1/63 |
主分类号 |
G01N21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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