发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which has small parasitic resistance of a source/drain region, and to provide a method of manufacturing the same. SOLUTION: The method of manufacturing the semiconductor device includes the steps of: forming a gate portion on an Si layer; introducing As into the Si layer located across the gate portion; depositing an Ni layer on the Si layer into which As is introduced; allowing the Ni layer to react with the Si layer using a heat treatment to form a first silicide layer and segregating As on the interface between the first silicide layer and Si layer; introducing Pt elements into the first silicide layer; and diffusing the Pt elements up to the Si layer by using a heat treatment to form a second silicide layer between the first silicide layer and Si layer and also segregating As on the interface of the second silicide layer and Si layer. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009141214(A) 申请公布日期 2009.06.25
申请号 JP20070317504 申请日期 2007.12.07
申请人 TOSHIBA CORP 发明人 MARUGAME TAKAO;YAMAUCHI TAKASHI;NISHI YOSHIFUMI;TSUCHIYA YOSHINORI;KATO KOICHI
分类号 H01L21/336;H01L21/28;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/417;H01L29/78 主分类号 H01L21/336
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