| 摘要 |
<P>PROBLEM TO BE SOLVED: To quickly detect a failure of a semiconductor device, etc., and suspend the resume of operation when a detected failure leads to a serious situation, thereby preventing the spreading of damage. <P>SOLUTION: When a failure of an inverter unit INV is detected at a failure detection processing step 21 for the inverter unit INV, the results of the detection are input to a failure processing step 22, at which the inverter unit INV is stopped, and is not immediately brought back into operation but a failure analyzing program processing step 23 is started. Subsequently, the failure analyzing program causes a predetermined operation mode to start, and the cause of a failure is assumed at a failure cause assuming processing step 24. Based on the assumption of the cause, whether the failure is negligible or fatal is determined at a failure determining processing step 25. If the failure is determined to be negligible, a countermeasure is performed by the failure analyzing program and the inverter unit INV is brought back into operation at an operation resuming processing step 26. If the failure is determined to be fatal, the inverter unit INV is not restarted, and the resume of operation of the inverter unit INV is suspended at an automatic operation resuming suspension processing step 27. <P>COPYRIGHT: (C)2009,JPO&INPIT |
