发明名称 METHODS OF FORMING A PATTERN OF A SEMICONDUCTOR DEVICE
摘要 In polymers for an anti-reflective coating, compositions for an anti-reflective coating and methods of forming a pattern of a semiconductor device using the same, the compositions for an anti-reflective coating include a polymer that includes a first repeating unit having a basic side group, a second repeating unit having a light-absorbing group, and a third repeating unit having a cross-linkable group; a photoacid generator; a cross-linking agent; and a solvent. The polymer for the anti-reflective coating, which may have a basic side group chemically bound to a backbone of the polymer, may properly adjust diffusion of an acid in an anti-reflective coating layer to improve the profile of a pattern.
申请公布号 US2009162796(A1) 申请公布日期 2009.06.25
申请号 US20080339863 申请日期 2008.12.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YUN HYO-JIN;KIM YOUNG-HO;KIM BOO-DEUK;PARK JI-MAN;RYU JIN-A;CHOI JAE-HEE
分类号 G03F7/20 主分类号 G03F7/20
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