发明名称 NONVOLATILE SEMICONDUCTOR STORAGE DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor storage device which can reduce a leak current in a row decoder, and is advantageous to prevent the erroneous deletion of a memory cell. <P>SOLUTION: The nonvolatile semiconductor storage device is provided with: a memory cell array which is composed of a plurality of blocks; and a row decoder 22 which is provided with first and second block selecting circuits RDn and RDn+3 which has a plurality of transfer transistors, in which ends of current paths are electrically connected to a plurality of the word lines, respectively, and are provided corresponding to a plurality of the blocks and are arranged adjacent to the direction of the word lines. Diffusion layers S which are ends of current paths of the transfer transistors are arranged so as to oppose each other in the first and second block selecting circuits, respectively. The width W2 between the diffusion layers adjacent to the first and second block selecting circuits in the direction of the word lines is arranged more greatly than the width W1 between the diffusion layers adjacent to the identical first and second block selecting circuits in the direction of the word lines (W2>W1). <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009141278(A) 申请公布日期 2009.06.25
申请号 JP20070318851 申请日期 2007.12.10
申请人 TOSHIBA CORP 发明人 IWAI MAKOTO;KANAZAWA KAZUHISA;NAKAMURA HIROSHI;FUJIO MASAKI
分类号 H01L21/8247;G11C16/04;G11C16/06;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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