发明名称 METHOD OF MANUFACTURING NITRIDE SEMICONDUCTOR LASER
摘要 The invention provides a high-reliability nitride semiconductor laser that reduces the stress of a nitride dielectric film formed on a resonator's end face, thus reducing possible damage to the resonator's end face, which may occur during the formation of the nitride dielectric film. A method of manufacturing a nitride semiconductor laser according to the invention uses a nitride-based III-V compound semiconductor and includes the steps of (a) forming an adherence layer of a nitride dielectric on both a light-emitting and a light-reflecting end face of a resonator in plasma containing a nitrogen gas; and (b) forming a low-reflective and a high-reflective face-coating film of a dielectric on the adherence layers.
申请公布号 US2009162962(A1) 申请公布日期 2009.06.25
申请号 US20080325354 申请日期 2008.12.01
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 SUZUKI YOSUKE;NAKAGAWA YASUYUKI;KURAMOTO KYOSUKE;SHIRAHAMA TAKEO
分类号 H01L21/02 主分类号 H01L21/02
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