发明名称 |
METHOD FOR FORMING DUAL GATE DIELECTRICS |
摘要 |
A method for forming a dual gate insulating layer is provided to stabilize a gate forming process and to prevent a leaning effect of a gate by preventing excessive loss of an isolation layer to form uniformly a surface of the isolation layer. A first gate insulating layer is formed on an upper surface of a semiconductor substrate(100) having first and second regions including an isolation region. A mask pattern is formed to cover the second region in order to expose the first region. The first gate insulating layer corresponding to the first region is removed in a dry etch manner by using the mask pattern. A removal process is performed to remove the mask pattern. A second gate insulating layer(110) is formed on the first and second regions.
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申请公布号 |
KR20090066484(A) |
申请公布日期 |
2009.06.24 |
申请号 |
KR20070134040 |
申请日期 |
2007.12.20 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JUNG NAM;OH, KEE JOON;KIM, GYU HYUN;HAN, JI HYE |
分类号 |
H01L21/31;H01L21/304 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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