发明名称 METHOD FOR FORMING DUAL GATE DIELECTRICS
摘要 A method for forming a dual gate insulating layer is provided to stabilize a gate forming process and to prevent a leaning effect of a gate by preventing excessive loss of an isolation layer to form uniformly a surface of the isolation layer. A first gate insulating layer is formed on an upper surface of a semiconductor substrate(100) having first and second regions including an isolation region. A mask pattern is formed to cover the second region in order to expose the first region. The first gate insulating layer corresponding to the first region is removed in a dry etch manner by using the mask pattern. A removal process is performed to remove the mask pattern. A second gate insulating layer(110) is formed on the first and second regions.
申请公布号 KR20090066484(A) 申请公布日期 2009.06.24
申请号 KR20070134040 申请日期 2007.12.20
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JUNG NAM;OH, KEE JOON;KIM, GYU HYUN;HAN, JI HYE
分类号 H01L21/31;H01L21/304 主分类号 H01L21/31
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