发明名称 METHOD OF IDENTIFYING ABNORMALITY AND ANALYSIS APPARATUS
摘要 <p>The present invention is characterized in that , in an analyzer which analyzes a specimen based on optical measurement and in an abnormality-identifying method for identifying an abnormality in the analyzer, a measurement result is obtained as a reference value using a low-concentration reagent containing a component in predetermined very low concentrations, and a measurement result is obtained as an abnormality-identification measurement value using a high-concentration reagent containing the component in predetermined high concentrations through an analysis process. An abnormality in the analysis process concerning removal of the high-concentration reagent is identified based on whether the abnormality-identification measurement value is within an acceptable range set based on the reference value.</p>
申请公布号 EP2072999(A1) 申请公布日期 2009.06.24
申请号 EP20070791693 申请日期 2007.07.31
申请人 OLYMPUS CORPORATION 发明人 KUBOTA, KIYOTAKA;FURUSAWA, YUKIHIRO;FUJIMORI, KOJI
分类号 G01N21/77 主分类号 G01N21/77
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