发明名称 Apparatus and method of detecting refresh cycle of semiconductor memory
摘要 An apparatus for detecting a refresh period of a semiconductor memory includes a signal generating unit that generates a plurality of signal pairs, each of which includes one among a plurality of first reference signals that are respectively generated with the same timing as first to (N-1)-th pulses of a refresh period signal of order N, and one among a plurality of second reference signals that correspond to the plurality of first reference signals and are respectively generated with the same timing as second to N-th pulses of the refresh period signal. A refresh period detecting unit detects the period of the refresh period signal using one among the plurality of signal pairs.
申请公布号 US7551504(B2) 申请公布日期 2009.06.23
申请号 US20060638363 申请日期 2006.12.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE KYONG-HA
分类号 G11C7/00 主分类号 G11C7/00
代理机构 代理人
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