发明名称 Werkwijze en systeem voor het splitsen van een patroonlayout.
摘要 A method for splitting a pattern layout including providing the pattern layout having features, checking the pattern layout to determine the features that require splitting, coloring the features that require splitting with a first and second color, resolving coloring conflicts by decomposing the feature with the coloring conflict and coloring the decomposed feature with the first and second color, and generating a first mask with features of the first color and a second mask with features of the second color.
申请公布号 NL2000656(C2) 申请公布日期 2009.06.23
申请号 NL20072000656 申请日期 2007.05.22
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 JAW-JUNG SHIN;KING-CHANG SHU;TSAI-SHENG GAU;BURN-JENG LIN
分类号 G03F1/14;G03F7/20 主分类号 G03F1/14
代理机构 代理人
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