发明名称 ULTRA-THIN SUBSTRATE FOR SEMICONDUCTOR PACKAGE, AND FABRICATION METHOD OF THE SAME, FABRICATION METHOD FOR SEMICONDUCTOR DEVICE THEREBY
摘要 <p>A ultra-thin semiconductor package substrate, a manufacturing method of a semiconductor package substrate, and a manufacturing method of a semiconductor device by using the same are provided to reduce a thickness of a substrate by eliminating a CCL(Copper-Clad Laminate). A gold plating process and a nickel plating process are sequentially performed to fill a region from which a first photoresist layer is removed. A copper-plated layer is electrically connected with a nickel-plated layer exposed through a second photoresist region. The copper-plated layer is formed to cover a surface including a second photoresist(130). The copper-plated layer includes a flat top surface. A third photoresist layer is formed on the copper-plated layer. The exposed copper-plated layer is removed by performing an etch process using a third photoresist. A part of a fourth photoresist layer is removed by an exposure-development process in order to expose a part of a circuit pattern. A fourth photoresist(160) is removed to connect electrically the nickel-plated layer and the gold-plated layer with the exposed circuit pattern.</p>
申请公布号 KR20090065117(A) 申请公布日期 2009.06.22
申请号 KR20070132566 申请日期 2007.12.17
申请人 SIMM TECH CO., LTD. 发明人 JUNG, CHANG BO;OH, CHOON HWAN
分类号 H01L23/31;H01L23/02 主分类号 H01L23/31
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