发明名称 LITHOGRAPHIC METHOD AND APPARATUS
摘要 A pattern transfer method, a lithographic apparatus and a carrier medium are provided to realize multiple patterning with improved resolution without physical and chemical changes of resist. A pattern transfer method comprises the following steps of: exposing a first region(308) to a first radiation dose, which can transform the first region of a phase change material layer formed on a substrate into an amorphous phase; exposing a second region(312) to a second radiation dose, which can transform the second region of the phase change material layer into the amorphous phase; and removing some regions of the phase change material layer except for the first and second regions in order to form patterns without the damage to the first and second regions. The phase change material layer contains chalcogenide alloy.
申请公布号 KR20090065457(A) 申请公布日期 2009.06.22
申请号 KR20080128056 申请日期 2008.12.16
申请人 ASML HOLDING N.V.;ASML NETHERLANDS B.V. 发明人 SEWELL HARRY;BENSCHOP JOZEF PETRUS HENRICUS
分类号 G03F7/20 主分类号 G03F7/20
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