发明名称 OBJECT RECOGNITION METHOD AND VISUAL INSPECTION APPARATUS OF SUBSTRATE USING THE METHOD
摘要 <P>PROBLEM TO BE SOLVED: To recognize easily and correctly an object having high specular reflection characteristics. <P>SOLUTION: A process of imaging a substrate S using camera 1 is performed twice, without changing the image target area after three illumination parts A, B, and C, arranged in directions forming respective different elevation angles with respect to the substrate S turn on colored lights different from one another. Then, at the second imaging, the illumination part A and the illumination part B are controlled so as to turn on the opposite colored lights to the first imaging. After the second imaging is finished, by using generated two color images, a binary color difference image, in which pixels of which color differences between the images exceed a predetermined threshold level are set as white pixels, is generated. Template matching on the color difference image is performed, by using model data (template) showing a soldered part, and a part where the degree of matching with the template is highest is determined as the soldered part. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009128345(A) 申请公布日期 2009.06.11
申请号 JP20070307346 申请日期 2007.11.28
申请人 OMRON CORP 发明人 WADA HIROTAKA
分类号 G01N21/956;G01B11/24;H05K3/34;H05K13/08 主分类号 G01N21/956
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