| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a failure diagnosis device capable of forcing registers of part of a boundary scanning test circuit mounted on an integrated circuit on a substrate as a shift register, and, during the period of normal operation, feedbacking to compare part of output signal at the output side to the input side to detect signal anomaly. <P>SOLUTION: The failure diagnosis device includes a first scanning circuit scanning input signal input from a former clause integrated circuit of a plurality of integrated circuits, a second scanning circuit scanning output signal output to a latter clause integrated circuit, an inspection circuit controlling the first and the second scanning circuit via a testing terminal arranged in each integrated circuit to inspect each integrated circuit on the basis of output signal from each scanning circuit, a comparing circuit arranged in at least one integrated circuit of each integrated circuit to compare output signal input from the second scanning circuit of latter clause via the test terminal with output signal from the first scanning circuit of self-integrated circuit during the period of normal operation, and an anomaly detection circuit for detecting anomaly of the self-integrated circuit on the basis of the comparison output from a comparing circuit during the period of normal operation. <P>COPYRIGHT: (C)2009,JPO&INPIT |
