发明名称 MEASURING METHOD FOR SPR AND SYSTEM THEREOF
摘要 <p>A measuring method for SPR and a system thereof are disclosed. Said method comprises: firstly a coherent broad-spectrum pulse light with linear polarization is irradiated on a surface of the SPR sample and a reflection occurs. Then said coherent broad-spectrum pulse light and/or said reflected light is monotonically chirped in the time domain. Finally, the SPR reflected light, which is monotonically chirped in time domain, is detected and a resonant wavelength information is obtained according to the detected signal.</p>
申请公布号 WO2009070913(A1) 申请公布日期 2009.06.11
申请号 WO2007CN03369 申请日期 2007.11.29
申请人 NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY, CHINA;BEIHANG UNIVERSITY;ZHENG, ZHENG;WAN, YUHANG;ZHAO, XIN;ZHU, JINSONG;FAN, JIANGFENG 发明人 ZHENG, ZHENG;WAN, YUHANG;ZHAO, XIN;ZHU, JINSONG;FAN, JIANGFENG
分类号 G01N21/55 主分类号 G01N21/55
代理机构 代理人
主权项
地址