| 摘要 |
PROBLEM TO BE SOLVED: To provide a socket for inspection, which allows an existing socket side to respond to design change even when design change of the dimension and angle of a mold of an IC, design change of a resin, or the like occurs. SOLUTION: The socket for inspection is an open top type IC socket used for inspecting a QFP, and has a centering mold guide allowing its position to be moved according to the dimension of the QFP. COPYRIGHT: (C)2009,JPO&INPIT
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