MATERIAL ANALYSIS DEVICE BASED ON EDGE-EMITTER SEMICONDUCTOR LASER CHRYSTAL, AND ASSICIATED ANALYSIS TOOL

摘要

An edge-emitter semiconductor laser crystal having a receptacle for sample material which can influence the crystal's laser operation. There may be separate zones of laser action within the crystal, creating respective sensing zones in the receptacle. Detection may be achieved by providing photo-diode regions within the crystal, for example.