| 摘要 |
<p>Disclosed is a testing apparatus for testing a device to be tested. The testing apparatus comprises a plurality of signal generating units and a decision unit for deciding the quality of the tested device. Each of the signal generating units includes a driver unit for feeding a test signal to a corresponding pin of the tested device, a voltage measuring unit for detecting the DC voltage of the signal outputted by the driver unit, on the basis of the signal outputted by the tested device in response to the test signal, and an output-side adjusting unit for adjusting the duty ratio of the signal outputted by the driver unit, in response to the DC voltage detected by the voltage measuring unit. Each level measuring unit is provided for measuring the voltage level which is applied to the tested device when a predetermined electric current is fed to the tested device.</p> |
