发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To form a micropattern without using a high-resolution exposure system. <P>SOLUTION: In the formation of a micropattern for forming an interconnecting line, a bridging film 6 having a size of (1/2)d is formed on both side faces of a resist film 5 having a size of 2d to form a line pattern having a size of 3d that is composed of the resist film 5 and the bridging film 6 and a space pattern having a minimum size of d. A first opening having the minimum size of d is formed on a second hard mask 4, using the resist film 5 and the bridging film 6 as a mask. The first opening is filled with a backfill material 7. On the second hard mask 4 and the backfill material 7, a bridging film 9 having the size of (1/2)d is formed on both side faces of a resist film 8 having the size of 2d that is shifted by the size 2d relative to the pattern of the resist film 5 to form a line pattern having the size of 3d that is composed of the resist film 8 and the bridging film 9 and a space pattern having the minimum size of d. A second opening having the minimum size of d is formed on the second hard mask 4, using the resist film 8 and the bridging film 9 as a mask. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009130291(A) 申请公布日期 2009.06.11
申请号 JP20070306533 申请日期 2007.11.27
申请人 TOSHIBA CORP 发明人 WADA MAKOTO;AZUMA KAZUYUKI;KAJITA AKIHIRO
分类号 H01L21/027;G03F7/20;G03F7/40;H01L21/3065;H01L21/3205 主分类号 H01L21/027
代理机构 代理人
主权项
地址