发明名称 PROBE CARD WITH OPTICAL TRANSMISSION MEANS AND MEMORY TESTER
摘要 <P>PROBLEM TO BE SOLVED: To provide a probe card with an optical transmission means and a memory tester. <P>SOLUTION: The probe card includes: two or more needles connected to test terminals formed in a memory; two or more first terminals connected to the needles; two or more second terminals connected to the outside and corresponding to the first terminals; and the optical transmission means connecting the first terminals and the second terminals. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009128358(A) 申请公布日期 2009.06.11
申请号 JP20080244985 申请日期 2008.09.24
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 SUH SUNG-DONG;HA KYOUNG-HO;KIM SEONG-GU;CHO SOO-HAENG;MIN BOK-KI;RYU HAN-YOUL
分类号 G01R1/073;G01R31/26;G01R31/28;H01L21/66 主分类号 G01R1/073
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