发明名称 |
PROBE CARD WITH OPTICAL TRANSMISSION MEANS AND MEMORY TESTER |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a probe card with an optical transmission means and a memory tester. <P>SOLUTION: The probe card includes: two or more needles connected to test terminals formed in a memory; two or more first terminals connected to the needles; two or more second terminals connected to the outside and corresponding to the first terminals; and the optical transmission means connecting the first terminals and the second terminals. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009128358(A) |
申请公布日期 |
2009.06.11 |
申请号 |
JP20080244985 |
申请日期 |
2008.09.24 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
SUH SUNG-DONG;HA KYOUNG-HO;KIM SEONG-GU;CHO SOO-HAENG;MIN BOK-KI;RYU HAN-YOUL |
分类号 |
G01R1/073;G01R31/26;G01R31/28;H01L21/66 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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