发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing apparatus exhibiting high surface processing capability and high throughput. SOLUTION: Four reverse U shaped antennas 61 are disposed on a periphery of processing container 37 at every 90 degree. An AC power supply 62 is connected to each antenna 61 via a rectifier 63 and a DC voltage power supply 64 is connected between the antenna 61 and the AC power supply 62. A first magnet 66 is disposed at the center of each antenna 61, and a pair of second magnets 67, 67 are deposited at both ends of an antenna 61. The first magnet 66 and the pair of the second magnets 67, 67 are arranged such that an external force is applied perpendicularly to a longitudinal plasma current induced by the antenna 61. A plurality of circular ring shaped wafer holders 55 for holding the wafer 1 from below are arranged in a boat 50. Hereby, a high plasma flow is generated and a flow of particles is guided in a wafer surface direction to enable high flux plasma to flow in between the wafers. This achieves high surface processing capability. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009130225(A) 申请公布日期 2009.06.11
申请号 JP20070305220 申请日期 2007.11.27
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 TAKEDA TAKESHI
分类号 H01L21/31;C23C16/50 主分类号 H01L21/31
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