发明名称 CLEANING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a cleaning device and method that remove foreign matter by a reliable washing without causing any damage or wearing on a probe needle and carries out the cleaning of the probe needle as simply as possible without requiring a great deal of change in the constitution of equipment. SOLUTION: Cleaning is conducted with a moving direction turn performed at a turning angle of 90°and by going through a plurality of cycles where a cleaning action is repeated 4 times as one cycle. Here, the cleaning action is carried out, for example, by a helical motion in the plurality of cycles, so that the cleaning action of each cycle is conducted at different positions within a cleaning surface 11a (in the drawing, it is marked as a contact position). In the example of the drawing, cleaning actions in two cycles (a series of cleaning actions of (1) to (5) and a series of cleaning actions of (5) to (9)) are shown. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009130202(A) 申请公布日期 2009.06.11
申请号 JP20070304771 申请日期 2007.11.26
申请人 FUJITSU MICROELECTRONICS LTD 发明人 NANBU TETSUHIRO;GIGA SUKEHIRO
分类号 H01L21/66;B08B1/00;G01R31/28 主分类号 H01L21/66
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