发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To increase the number of rewritings by preventing an accumulation of a charge trapping. SOLUTION: A memory cell MC includes: a semiconductor substrate 10; a first gate insulating layer 11 formed on the semiconductor substrate; a floating gate 12 formed on the semiconductor substrate 10 through the first gate insulating layer 11; a second gate insulating layer 13 formed on the floating gate 12; and a control gate 14 formed on the floating gate 12 through the second gate insulating layer 13. The memory cell arrays are composed by arranging the memory cell MC in a plurality of matrix shapes. The first gate insulating layer 11 is a first cavity layer. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009129981(A) 申请公布日期 2009.06.11
申请号 JP20070300776 申请日期 2007.11.20
申请人 TOSHIBA CORP 发明人 IKEHASHI TAMIO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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