发明名称 SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURE
摘要 In various embodiments, semiconductor structures and methods to manufacture these structures are disclosed. In one embodiment, a method includes removing a portion of a semiconductor material to form a first protrusion and a cavity having a boundary that is below a surface of the semiconductor material, wherein the first protrusion extends from the boundary of the cavity. The method further includes forming a non-conformal material over a first portion of the first protrusion using an angled deposition of the non-conformal material, wherein the angle of deposition of the non-conformal material is non-perpendicular to the surface of the semiconductor material. Other embodiments are described and claimed.
申请公布号 US2009146244(A1) 申请公布日期 2009.06.11
申请号 US20080330748 申请日期 2008.12.09
申请人 TISCHLER MICHAEL ALBERT 发明人 TISCHLER MICHAEL ALBERT
分类号 H01L29/06;H01L21/76 主分类号 H01L29/06
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