发明名称 |
CHECKING AN ESD BEHAVIOR OF INTEGRATED CIRCUITS ON THE CIRCUIT LEVEL |
摘要 |
A system and a method for checking the ESD behavior, wherein a circuit (7) is automatically checked on the circuit plan level, in that technology-specific ESD data are provided in a database (2) for all components occurring in the circuit and are used for analyzing the ESD behavior, without complex circuit simulations being necessary, for example, based on front end or back end data, in consideration of the layout. |
申请公布号 |
WO2009071646(A2) |
申请公布日期 |
2009.06.11 |
申请号 |
WO2008EP66838 |
申请日期 |
2008.12.04 |
申请人 |
X-FAB SEMICONDUCTOR FOUNDRIES AG;BERGMANN, LARS;KONRAD, ANGELA;FRANK, MARKUS |
发明人 |
BERGMANN, LARS;KONRAD, ANGELA;FRANK, MARKUS |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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