发明名称 CHECKING AN ESD BEHAVIOR OF INTEGRATED CIRCUITS ON THE CIRCUIT LEVEL
摘要 A system and a method for checking the ESD behavior, wherein a circuit (7) is automatically checked on the circuit plan level, in that technology-specific ESD data are provided in a database (2) for all components occurring in the circuit and are used for analyzing the ESD behavior, without complex circuit simulations being necessary, for example, based on front end or back end data, in consideration of the layout.
申请公布号 WO2009071646(A2) 申请公布日期 2009.06.11
申请号 WO2008EP66838 申请日期 2008.12.04
申请人 X-FAB SEMICONDUCTOR FOUNDRIES AG;BERGMANN, LARS;KONRAD, ANGELA;FRANK, MARKUS 发明人 BERGMANN, LARS;KONRAD, ANGELA;FRANK, MARKUS
分类号 G06F17/50 主分类号 G06F17/50
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