发明名称 DIGITAL TEMPERATURE INFORMATION GENERATING APPARATUS FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a digital temperature information generating apparatus for a semiconductor integrated circuit that generates digital temperature information and outputs the digital temperature information to the outside of the semiconductor integrated circuit. SOLUTION: The digital temperature information generating apparatus for the semiconductor integrated circuit includes a temperature information generating block that, in response to a reset signal, latches and decodes multiple divided signals obtained by multiple-dividing a second control signal at a timing corresponding to a change in period of a first control signal according to a temperature, and generates temperature information, and pads through which the generated temperature information is outputted. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009130927(A) 申请公布日期 2009.06.11
申请号 JP20080128130 申请日期 2008.05.15
申请人 HYNIX SEMICONDUCTOR INC 发明人 HONG YUN SEOK
分类号 H03K19/00;G11C11/406 主分类号 H03K19/00
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