发明名称 Semiconductor Device formed in a Recrystallized Layer
摘要 A semiconductor device includes a substrate that includes a first layer and a recrystallized layer on the first layer. The first layer has a first intrinsic stress and the recrystallized layer has a second intrinsic stress. A transistor is formed in the recrystallized layer. The transistor includes a source region, a drain region, and a charge carrier channel between the source and drain regions. The second intrinsic stress is aligned substantially parallel to the charge carrier channel.
申请公布号 US2009146146(A1) 申请公布日期 2009.06.11
申请号 US20090368122 申请日期 2009.02.09
申请人 KNOEFLER ROMAN;TILKE ARMIN 发明人 KNOEFLER ROMAN;TILKE ARMIN
分类号 H01L29/78;H01L21/20;H01L29/04 主分类号 H01L29/78
代理机构 代理人
主权项
地址